Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

Publisher:
International Electrotechnical Commission - Publicly Available Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Edition :	1.0
File Size :	1 file , 1000 KB
Note :	This product is unavailable in Canada
Number of Pages :	23
Published :	09/18/2007

IEC/PAS 62396-2 Ed. 1.0 en:2007 PDF

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

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